MIL-DTL-20517J (AR)
in 4.5.4. If any charge case assembly fails to comply with drawing 8848485, it shall be
considered a critical defect and the lot shall be rejected. (Destructive test)
4.4.6 Dynamic functioning.
4.4.6.1 Normal sampling. Beginning with the first lot produced and continuing
until three numerically consecutive lots have been complied with the applicable
requirements specified, two hundred (200) simulator assemblies shall be selected from
each lot for testing. The lot shall be rejected if, during the test, a critical defect occurs or
if five (5) or more assemblies exhibit any of the remaining major defects listed in Table
IV. The lot shall also be rejected if the total of minor and major defects equal six (6) or
more when tested in accordance with 4.5.5. (Destructive test) Resubmitted lots shall not
be used to meet the criteria of "numerically consecutive lots".
TABLE IV. Functioning Defects
Requirement
Classification
Defect
3.4.1
Major
Case Failure
3.4.2
Major
Charge case assembly fails to burst high order
3.4.3
Critical
Charge Case Assembly bursts in less than 1.8 seconds
or more than 3.4 seconds
3.4.3
Major
Charge case assembly bursts in less than 2.0 seconds
but not less than 1.8 seconds, or bursts in more than
3.2 seconds but not more than 3.4 seconds
3.4.3
Minor
Charge case assembly bursts in less than 2.2 seconds
but not less than 2.0 seconds, or bursts in more than
3.0 seconds but not more than 3.2 seconds
3.4.4
Critical
Charge case assembly fails to expel within 150
milliseconds upon functioning of the primer
3.4.5
Critical
Horizontal Distance less than 100 feet or altitude less
than 50 feet
3.4.6
Major
Primer fails to function
NOTE: If sound is used in the measurement of functioning time, the time required for
the sound to travel from the source to the measuring device must be considered.
4.4.6.2 Reduced sampling plan. After three successful, numerically consecutive
lots have been complied with the criteria of 4.4.6.1, eighty (80) assemblies shall be
selected from each lot for test. The lot shall be rejected if, during the test, a critical defect
occurs or if three (3) or more assemblies exhibit any of the remaining major defects as
listed in Table IV. The lot shall also be rejected if the total of minor and major defects
equal four (4) or more when tested in accordance with 4.5.5. (Destructive test)
Resubmitted lots shall not be used to meet the criteria of "numerically consecutive lots".
4.4.6.3 Reduced to normal sampling plan. When one lot has been rejected or
withheld after being compiled in accordance with 4.4.6.2, the sample size shall be
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